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Fault Tolerance and Reliability Techniques for High-Density Random-Access Memories
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Author: Kanad Chakraborty, Pinaki Mazumder
List Price: $100.00
Our Price: Click to see the latest and low price
ISBN: 0130084654
Publisher: Prentice Hall PTR (15 June, 2002)
Edition: Hardcover
Sales Rank: 1,146,493
Average Customer Rating: 5 out of 5
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Customer ReviewsRating: 5 out of 5
The Encyclopedia of Fault Tolerant RAM Design
Archeologists today are in possession of clay tablets that still bear on their surface the symbols that were written on them over 6000 years ago. As a result of improvements in fabrication technology, today's integrated circuits can store many millions of times as much data in the same volume. Further improvements are expected - within 10 years it is expected that silicon chips with a billion transistors will be manufactured. The downside, of course, is that these circuits are extremely fragile. The stored data and the circuits themselves are prone to a host of destructive forces. For example, a single alpha particle does not pose a threat to the writing on a clay tablet, but can change a RAM-cell bit. The problem affects more than just the commodity memory industry, since a larger and larger portion of many kinds of chips consists of memory arrays.Over the years a vast amount of research has been dedicated to finding ways around this problem. This book, with a bibliography of 525 research papers, is a unique and comprehensive survey of the field. The mechanisms underlying hard and soft errors are described. The techniques for coping with these mechanisms include test and repair algorithms, built-in self-repair, reconfiguration, process and circuit techniques, and error-detecting and correcting codes. The book can be useful for designers, manufacturing engineers, test engineers and researchers.
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